Figure 12 Variation of the on-current I on Bucladesine mouse versus uniaxial strain. Figure 13 Variation of the off-current I off

versus uniaxial strain. Figure 14 Variation of the ratio I on / I off versus uniaxial strain. Figure 15 Variation of I on versus I on / I off ratio for various strain values. Intrinsic delay time τ s is also an important performance metric that characterizes the limitations on switching speed and AC operation of a transistor. Once the gate capacitance is calculated, τ s is given by [28]. (16) where the on-current is the drain current at V G= V D=V DD. Apparently, the switching delay time τ s has similar variation as the gate capacitance has with strain, as it is depicted in Figure 16. Moreover, as it is seen from Figure 17, the switching delay time abruptly see more decreases with strain before the ‘turning point’ of band gap variation but increases rapidly after this point. We can say that switching performance improves with the tensile strain that results in smaller band gap whereas degrades with the tensile strain that

results in a larger band gap. It is worth noting that the switching delay time for the unstrained case (ε=0%) is found to be τ s ∼23 fs/nm, that is VX-809 cost at least three times larger than the corresponding delay time in uniaxially strained-GNR case. Figures 18 and 19 show the switching delay time τ s as a function of on-current I on and I on/I off ratio, respectively. For digital applications, high I on/I off ratio and low switching time delay are required. However, when the I on/I off ratio improves with the applied tensile strain, the I on and switching performance degrade and vice versa. Another key parameter in the switching performance of the device is the power-delay product P τ s =(V DD I on)τ s that represents the energy consumed per switching event of the device. Figures 20 and 21 illustrate the dependence o of power-time delay product P τ s on strain and on I on/I off ratio, respectively, where similar PFKL behavior to that of switching delay-time can be observed.

Figure 16 Switching delay time τ s / L G versus gate voltage for various uniaxial strains. Figure 17 Switching delay time τ s / L G versus uniaxial strain in the on-state V GS = V DS =0 . 5 V. The delay time τ s /L G for the unstrained case (ε=0%) (not shown) is found to be approximately 23 fs/nm. Figure 18 Switching delay time τ s / L G versus on current I on for various uniaxial strains. Figure 19 Switching delay time τ s / L G versus I on / I off -ratio for various uniaxial strains. Figure 20 Power-delay time product P τ s / L G versus uniaxial strain in the on-state V GS = V DS =0 . 5 V for various uniaxial strains. Figure 21 Power-delay time product P τ s / L G versus I on / I off -ratio for various uniaxial strains. Conclusions We investigated the uniaxial tensile strain effects on the ultimate performance of a dual-gated AGNR FET, based on a fully analytical model.